142 – Zetec Zircon Phased Array & TOFD

The Zetec Zircon Phased Array and TOFD course enables students to recognize the full potential achieved using both PA and TOFD methods. Practical exercises access a selection of engineered and actual flaw samples. The PA and TOFD capabilities of the Zircon instrument will be examined in detail, with emphasis on technique development and ASME code case 2235 implementation. We recommend that attendees have attained Level 2 or 3 certification in industrial ultrasonics and have a working knowledge of the Zetec UltraVision software/instrument prior to attending this course.

Objectives

System calibration
Navigation of the software interface
Variable parameter inputs
Linear and sectorial scan definitions
Layout – acquisition/analysis
Data acquisition and interpretation
System linearity assessment
Flaw location and sizing
TOFD theory and applications, including:
- DAC, TCG
- Optimizing PCS and angles
- Limitations of detection and resolution
- Dead zone coverage
- Encoder calibration
- TOFD calibration and optimization
- TOFD analysis

Suitable For

The course is designed for any Level 2 or 3 UT technician who is required to perform data analysis or is tasked with procedure and technique development. The benefit to the employer will be significant, as the graduate of this course will be capable of analyzing, solving and reporting clear comprehensive findings for many NDT/ NDE applications.

Duration

5 days (40 hours)

50% classroom, 40% hands-on, 10% testing

Course Equipment and Materials

Instrumentation, phased array and TOFD probes and wedges are just a part of the extensive equipment list included in this course. The addition of a wide range of flaw samples, and the calibration blocks required to explore and understand the system functionality, rounds off the gear. Dedicated computers with UltraVision and ESBeamTool ensure students will get the very best experience from this training program.